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    Title :

    Defect Detection on Patterned Jacquard Fabric


    Contributors:
    Ngan, H. (author) / Pang, G. (author) / Yung, S. (author) / Ng, M. (author) / Williams, E.

    Conference:

    32nd, Applied imagery pattern recognition workshop ; 2003 ; Washington, DC



    Publication date :

    2004-01-01


    Size :

    6 pages


    Remarks:

    Also Known as AIPR 2003



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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