101–120 of 320 hits
|

    Radiation-induced resistance changes in TaOx and TiO2 memristors

    Hughart, D. R. / Lohn, A. J. / Mickel, P. R. et al. | IEEE | 2014

    Investigation of the SOA fast-dynamics for 160 Gbit/s applications

    Bogoni, A. / Poti, L. / Ghelfi, P. et al. | IEEE | 2003

    Ultra-wide spectrum quantum dot superluminescent diodes emitting at 1.3 /spl mu/m

    Rossetti, M. / Li, L.H. / Markus, A. et al. | IEEE | 2005

    Optically induced switching in CdZnTe

    Zappettini, A. / Cerati, L. / Milani, A. et al. | IEEE | 1999

    Introscopy of solids at Novosibirsk terahertz free electron laser

    Cherkassky, V. S. / Knyazev, B. A. / Ivanov, G. M. et al. | IEEE | 2006

    Airplane Subsystem Testing at The Military University of Technology

    Wojtowicz, K. / Henzel, M. / Wazny, M. et al. | IEEE | 2019

    Parametric performance analysis of battery operated electric vehicle

    Loganathan, M. K. / Tan, C. M. / Sultana, Sahnin et al. | IEEE | 2021

    Dynamic situation and threat assessment for collision warning systems: the EUCLIDE approach

    Polychronopoulos, A. / Tsogas, M. / Amditis, A. et al. | IEEE | 2004

    Blackbird: Object-Oriented Planning, Simulation, and Sequencing Framework Used by Multiple Missions

    Lawler, Christopher R. / Ridenhour, Forrest L. / Khan, Shaheer A. et al. | IEEE | 2020

    Kalman-kriging technique applied to space-aided distributed sensor system to manage critical environmental events

    Andria, Gregorio / Di Sciascio, Eugenio / Lanzolla, Anna M. L. et al. | IEEE | 2016

    A New Tool for Merging the Information Based on Clustering Methods

    Garfias, J. M. T. / Molina, A. O. / Linares Flores, Jesus et al. | IEEE | 2011

    Field tests of distributed temperature and strain measurement for smart structures

    Thevenaz, L. / Facchini, M. / Fellay, A. et al. | IEEE | 2001

    Comparative Study of a PID and PD Control Bounded by Hyperbolic Tangent Function in Robot 3 DOF

    Jimenez-Uribe, A / Serna-Hernandez, L. F. / Hernandez-Paredes, J. M. et al. | IEEE | 2015