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Halbleiterbauelement
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Finite difference approach to optical scattering of gratings [5188-43]
Image detection system for 157 nm using fluorescent glass [5188-16]
Quadrature phase-shift interferometer (QPSI) decoding algorithms and error analysis [5188-09]
Radioactive decay of excitations in ZnSe (Te) [5188-45]
Information reconstruction based on phase-shifting technique in digital holography [5188-44]
Accuracy of optical thin film parameter determination based on spectrophotometric data [5188-24]
VUV light-scattering measurements of substrates and thin film coatings [5188-14]
Double-diode configuration of self-calibrating photodiodes [5188-42]
Phase-shifting algorithm via wavelength tuning based on temporal Fourier transform [5188-41]
Absolute high-accuracy deflectometric measurement of topography [5188-39]
Photothermal microscopy and laser damage in optical components (Invited Paper) [5188-22]
Infrared applications of semiconductors: materials, processing, and devices
Optical Gain and Drift Velocity of Photoexcited Carriers in MQW IR Detectors
Controlling the Active Area of HgCdTe Photodiodes Using an Internal Electric Field
Gate Recess Etch Contributions to Source Resistance