Accuracy of optical thin film parameter determination based on spectrophotometric data [5188-24]
Accuracy of optical thin film parameter determination based on spectrophotometric data [5188-24]
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- New search for: Trubetskov, M. K.
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Document information
Accuracy of optical thin film parameter determination based on spectrophotometric data [5188-24]
Annual conference, Advanced characterization techniques for optics, semiconductors, and nanotechnologies
2003-01-01
10 pages
Conference paper
English
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