New tester simulates auto stresses on semiconductors
Elektronischer Messstellenumschalter mit MOS-Bauelementen
Halfgeleiders in de energietechniek, 8b : Netherlands railways em '64 chopper coaches
Changing pattern of electronic control systems for electric vehicles
Definition of driver information instrumentation feature
Illumination-tolerant vision system aids drivers
In situ Defect-screening of Integrated LDMOS for Critical Automotive Applications
Future challenges in testing automotive semiconductor devices
Satellite X4: The 100-element self-scanned photodiode array experiment