Nickel silicide contacts on SiC substrates can peel off their metal stacks. We found that this failure is caused by the interfacial accumulation of carbon atoms migrating from carbon precipitates in NiSi. To overcome this failure, we developed a technique for removing carbon precipitates by thermal oxidation. This is followed by a buffered hydrofluoric acid (HF) scrubbing treatment before metal deposition. The technique was used to fabricate heat-resistant Ni silicide contacts with a Ti/Ni/Ag bottom electrode. The contacts displayed very low specific resistance.


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    Title :

    Heat resistant metallization technique for SiC power devices


    Additional title:

    Hitzebeständige Metallisierungstechnik für SiC-Starkstromeinrichtungen


    Contributors:

    Published in:

    Publication date :

    2008


    Size :

    6 Seiten, 9 Bilder, 22 Quellen



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English




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