In this paper experimental results on radiation effects on a BICMOS high-speed standard commercial technology, manufactured by ST-Microelectronics, are reported. Bipolar transistors were irradiated by neutrons, ions, or by both of them. Fast neutrons, as well as other types of particles, produce defects, mainly by displacing silicon atoms from their lattice positions to interstitial locations, i.e. generating vacancy-interstitial pairs, the so-called Frenkel pairs. Defects introduce trapping energy states which degrade the common emitter current gain beta. The gain degradation has been investigated for collector current, Ic, between 1 microA and 1 mA. It was found a linear dependence of Delta(1/beta) = 1/betai - 1/beta (where betai and beta are the gain after and before the irradiation) as a function of the concentration of Frenkel pairs. The bipolar transistors made on this technology have shown to be particularly radiation resistant. For instance, npn small area transistors have a gain variation (beta - betai)/beta, lower than 10 % for doses of about 0.5 MRad and collector currents of 1 microA, well suited for low power consumption space application
Effects of ionizing radiation on BICMOS components for space application
Auswirkungen ionisierender Strahlung auf BiCMOS-Komponenten für die Raumfahrt
2002
10 Seiten, 11 Bilder, 3 Tabellen, 18 Quellen
Conference paper
English
Effects of ionization radiation on BICMOS components for space application
British Library Conference Proceedings | 2002
|Ionizing Radiation in Space and Space Flights
NTIS | 1972
|NTRS | 1968
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