Dynamic substrate bias to achieve radiation hardening

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Dynamic substrate bias to achieve radiation hardening

Dynamic substrate bias to achieve radiation hardening

DeBar, D.E.

A substrate bias compensation circuit is described which monitors the threshold voltage of a sample FET circuit on an integrated circuit chip and modifies the substrate voltage for a chip to compensate for variations in the monitor threshold voltage due to radiation damage such as might occur in a space satellite exposed to a solar flare.

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Title :

Dynamic substrate bias to achieve radiation hardening

Additional title:

Dynamische Substratvorspannung zur Erzielung von Strahlungshaerte

Contributors:

DeBar, D.E. (author)

Published in:

IBM Technical Disclosure Bulletin ; 25 , 11A ; 5829-5830

Publication date :

1983

Size :

2 Seiten

Type of media :

Article (Journal)

Type of material :

Print

Language :

English

Keywords :

SUBSTRAT , SCHWELLENWERT , ELEKTRISCHE VORSPANNUNG , STRAHLUNGSFESTIGKEIT , RAUMFAHRTTECHNIK , MONOLITHISCH INTEGRIERTE SCHALTUNG , KOMPENSATION (HALBLEITER) , FELDEFFEKTTRANSISTOR , LICHTEMPFINDLICHKEIT

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