Proc. Automated testing for electron. manufacturing seminar exhibit, June 16-19, 1980, Boston, USA (Ate system technology)

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Proc. Automated testing for electron. manufacturing seminar exhibit, June 16-19, 1980, Boston, USA (Ate system technology)

Loose, R.H.: Wiring verification test of electronic switching systems: A host controlled, multiple facility, data distribution system (1-14). -- Goodson, R.M.: Semiconductor screening - a primer (15-23). -- Eppel, J.C.;McNeill, Jr., W.E.: A mobile automatic test system (MATS) for research aircraft instrumentation (24-43). -- Synadinos, K.G.: In-circuit testing: analysis of empirical information (44-53)

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Title :

Proc. Automated testing for electron. manufacturing seminar exhibit, June 16-19, 1980, Boston, USA (Ate system technology)

Additional title:

Tagungsberichte des Seminars mit Ausstellung ueber automatisches Pruefen in der Fertigung elektronischer Komponenten, 16.-19. Juni 1980, Boston, USA (Systemtechnologie der Testautomaten)

Publication date :

1980

Size :

53 Seiten

Type of media :

Conference paper

Type of material :

Language :

English

Keywords :

TAGUNG , PRUEFGERAET , PRUEFUNG , PRUEFAUTOMAT , HALBLEITERBAUELEMENT , DATENTECHNIK , FLUGZEUG , AVIONIK , PRUEFVERFAHREN , ELEKTRONISCHE SCHALTUNG , WAEHLERSYSTEM