This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers. This document is based on based on laws of physics and basic stable technology which is not dynamic in nature.


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Test Device Head Contact Duration Analysis


    Publication date :

    2016-07-12



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English








    Effect of Long-Duration Impact on Head

    Thomas, L M. / Hodgson, V. R. | SAE Technical Papers | 1972