Techniques for Suspect/Counterfeit EEE Parts Detection by Acoustic Microscopy (AM) Test Methods

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Techniques for Suspect/Counterfeit EEE Parts Detection by Acoustic Microscopy (AM) Test Methods

Through the use of ultra-high frequency ultrasound, typically above 10 MHz, Acoustic Microscopy (AM) non-destructively finds and characterizes physical features and latent defects (visualization of interior features in a layer by layer process) - such as material continuity and discontinuities, sub-surface flaws, cracks, voids, delaminations and porosity. AM observed features and defects can be indicators that the components were improperly handled, stored, altered or previously used. If AS6171/6 is invoked in the contract, the base document, AS6171 General Requirements shall also apply. This document provides guidance and requirements on the Acoustic Microscopy (AM) test procedures to be employed by the Test Laboratory (Lab) for the non-destructive AM testing of parts for suspect counterfeit (SC) part detection. The level of testing shall be derived by the User Organization working in conjunction with the Test Lab, taking into consideration the risk level as defined in the SC part detection flow specified herein. It shall be the responsibility of the Test Lab to conduct the AM test following the sequence of inspections for a given risk level specified herein. The creation of this document is a step in addressing the ever-increasing global problem of electronic parts counterfeiting.