Measurement of hemispherical total emittance, ε H material for cryogenic engineering in the temperature range of 10∼50K is proposed. This measurement is based on calorimetric method and ε H is obtained by measuring a sample temperature corresponding to heat input to a sample heater. In order to verify this method, the parameter ε H is analyzed for a test chamber by using a thermal mathematical model.


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Measurement of Hemispherical Total Emittance in Cryogenic Temperature


    Additional title:

    Sae Technical Papers


    Contributors:

    Conference:

    International Conference On Environmental Systems ; 1994



    Publication date :

    1994-06-01




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Measurement of Total Hemispherical Emittance at Cryogenic Temperatures

    Ohnishi, Akira / Furusawa, Tohru / Nagasaka, Yuji | SAE Technical Papers | 1996


    Simultaneous Measurement of Solar Absorptance and Total Hemispherical Emittance

    Ohnishi, A. / Tanaka, K. / Hatada, T. et al. | SAE Technical Papers | 1988


    Measurement of Total Hemispherical Emittance on Spacecraft Thermal Control Coatings

    Padmanabhan / Ramasamy, A. / Murthy, H. Narayana et al. | SAE Technical Papers | 1992