The purpose of this test was to characterize the single-event effects (SEE) susceptibility of the Texas Instrument (TI) DRV8881 2.5A Dual H-Bridge Motor Driver. The device’s output was monitored for changes during exposure to heavy-ions at Lawrence Berkeley National Laboratory (LBNL) 88-inch Cyclotron. The main goal of testing was to test for destructive SEEs. Nondestructive SEEs were recorded during testing but not fully characterized. Testing was performed on November 9th and 11th, 2022.


    Access

    Access via TIB

    Check availability in my library


    Export, share and cite



    Title :

    Texas Instrument DRV8881 2.5A Dual H-Bridge Motor Driver Heavy-Ion Single-Event Effects Test Report


    Contributors:

    Publication date :

    2023-06-01


    Type of media :

    Report


    Type of material :

    No indication


    Language :

    English





    SSD1351 OLED Display Driver Single Event Effects Test Report

    Landen D Ryder / Edward J Wyrwas | NTRS | 2023


    Motor bridge driver circuit

    KUDANOWSKI MACIEJ | European Patent Office | 2019

    Free access

    Motor Bridge Driver Circuit

    KUDANOWSKI MACIEJ | European Patent Office | 2016

    Free access

    A MOTOR BRIDGE DRIVER CIRCUIT

    KUDANOWSKI MACIEJ | European Patent Office | 2015

    Free access