Access

    Access via TIB

    Check availability in my library


    Export, share and cite



    Title :

    Atomic Force Microscope for the Study of Mars Dust and Soil


    Contributors:
    Pike, W. (author) / Anderson, M. (author)

    Conference:

    Micromission Workshop and Conference


    Publication date :

    1999-02-01


    Type of media :

    Conference paper


    Type of material :

    No indication


    Language :

    English




    Atomic-force microscope makes silicon microlenses

    British Library Online Contents | 2005


    Miniaturized atomic force microscope for planetary exploration

    Gautsch, S. / Staufer, U. / Akiyama, T. et al. | British Library Conference Proceedings | 2001


    Atomic-force microscope can watch paint dry

    British Library Online Contents | 2005


    Miniaturized atomic force microscope for planetary exploration

    Gautsch, S. / Staufer, U. / Akiyama, T. et al. | Tema Archive | 2001


    Atomic-Force Microscope Study of Excimer-Laser-Treated Graphite Surfaces [3573-34]

    Mechler, A. / Heszler, P. / Kantor, Z. et al. | British Library Conference Proceedings | 1998