Temperature dependence of optical constants of silicon for short wavelength FIR laser lines
Temperature dependence of optical constants of silicon for short wavelength FIR laser lines
- New search for: Nakayama, K.
- New search for: Okajima, S.
- New search for: Ohkuma, H.
- New search for: Kawahata, K.
- New search for: Tanaka, K.
- New search for: Tokuzawa, T.
- New search for: Akiyama, T.
- New search for: Ito, Y.
- New search for: Nakayama, K.
- New search for: Okajima, S.
- New search for: Ohkuma, H.
- New search for: Kawahata, K.
- New search for: Tanaka, K.
- New search for: Tokuzawa, T.
- New search for: Akiyama, T.
- New search for: Ito, Y.
Using far-infrared (FIR) lasers of 119, 71, 57, and 48 /spl mu/m in wavelength, optical constants (refractive index and absorption coefficient) of a high resistive silicon at 10, 19, and 29/spl deg/C have been measured in order to design a window and a beam splitter of a multi-channel measurement system such as fusion plasma diagnostics. The silicon has a resistivity of about 2.8 k/spl Omega//spl middot/cm. It has been found that the refractive index is sensitive for a change in the temperature. The window and the beam splitter at several temperatures have been designed.
Document information
Temperature dependence of optical constants of silicon for short wavelength FIR laser lines
2005-01-01
426909 byte
Conference paper
Electronic Resource
English
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