Absolute frequency measurement of an acetylene-stabilized laser at 1542 nm without carrier-envelope offset frequency control
Absolute frequency measurement of an acetylene-stabilized laser at 1542 nm without carrier-envelope offset frequency control
- New search for: Jie Jiang,
- New search for: Onae, A.
- New search for: Matsumoto, H.
- New search for: Feng-Lei Hong,
- New search for: Jie Jiang,
- New search for: Onae, A.
- New search for: Matsumoto, H.
- New search for: Feng-Lei Hong,
Based on a mode-locked Ti:sapphire laser and sum-frequency generation, the absolute frequency of a 1542-nm acetylene-stabilized laser is measured without carrier-envelope offset frequency control. A difference-frequency generation comb at telecom region is also realized.
Document information
Absolute frequency measurement of an acetylene-stabilized laser at 1542 nm without carrier-envelope offset frequency control
(CLEO). Conference on Lasers and Electro-Optics, 2005. ; 2 ; 1399-1401 Vol. 2
2005-01-01
567782 byte
Conference paper
Electronic Resource
English
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