The fabrication procedure of transparent and conducting ZnO films yielding ohmic contacts to p-GaN has been developed. The microstructure and electronic properties of p-GaN/ZnO interface were studied using atomic force and electron transmission microscopies, and X-ray photoelectron spectrometry. The observed ohmic behaviour is explained in terms of formation of a tunnelling p-GaN/ n/sup +/-ZnO junction.


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    Title :

    Zinc oxide as a contact material for p-GaN


    Contributors:
    Kaminska, E. (author) / Piotrowska, A. (author) / Barcz, A. (author) / Golaszewska, K. (author) / Kuchuk, A. (author) / Szade, J. (author) / Winiarski, A. (author) / Wawro, A. (author) / Jasinski, J. (author) / Liliental-Weber, Z. (author)


    Publication date :

    2002-01-01


    Size :

    421135 byte





    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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