To provide a test method, a test program, and a test system for improving accuracy and efficiency of a water tank test using a model vessel.SOLUTION: A test method for practically carrying out testing for a model vessel extracts related parameters (resistance value (RT), vessel speed (Vs)) greatly affecting variation in test results of specific parameters (wave resistance coefficient (Cw), propulsion decrease coefficient (1-t)) acquired by the model vessel testing, and the testing is carried out by taking into consideration the related parameters (resistance value (RT), vessel speed (Vs)) in a range where variation occurs.SELECTED DRAWING: Figure 1

    【課題】模型船を用いた水槽試験の精度向上及び効率化に資する模型船の試験方法、試験プログラム、及び試験システムを提供すること。【解決手段】模型船の試験を合理的に行う試験方法であって、模型船の試験で取得する特定パラメータ(造波抵抗係数(Cw)、推力減少係数(1−t))の試験結果のばらつきに影響の大きい関連パラメータ(抵抗値(RT)、船速(Vs))を抽出し、ばらつきを生ずる範囲の関連パラメータ(抵抗値(RT)、船速(Vs))を考慮して試験を計画して行う。【選択図】図1


    Access

    Download


    Export, share and cite



    Title :

    TEST METHOD, TEST PROGRAM, AND TEST SYSTEM FOR MODEL VESSEL


    Additional title:

    模型船の試験方法、試験プログラム、及び試験システム


    Contributors:

    Publication date :

    2020-10-01


    Type of media :

    Patent


    Type of material :

    Electronic Resource


    Language :

    Japanese


    Classification :

    IPC:    B63B Schiffe oder sonstige Wasserfahrzeuge , SHIPS OR OTHER WATERBORNE VESSELS / G01M TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES , Prüfen der statischen oder dynamischen Massenverteilung rotierender Teile von Maschinen oder Konstruktionen



    Pressure vessel burst test program. II

    CAIN, MAURICE / SHARP, DOUGLAS / COLEMAN, MICHAEL | AIAA | 1991


    A TEST TANK FOR A VESSEL MODEL TEST

    LEE CHANG HOON / JUNG JAE SANG / NAHM JONG OU | European Patent Office | 2017

    Free access


    Pressure vessel burst test program - Initial program paper

    CAIN, MAURICE / SHARP, DOUGLAS / COLEMAN, MICHAEL et al. | AIAA | 1990


    EXCITER TEST PILLAR FOR VESSEL

    KIM SU KYUNG / YOO DONG HWA / MOON JAE CHUL | European Patent Office | 2015

    Free access