Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Identification of Correlated Damage Parameters under Noise and Bias Using Bayesian Inference


    Contributors:
    An, Dawn (author) / Choi, Jooho (author) / Kim, Nam Ho (author)

    Conference:

    52nd AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics and Materials Conference



    Publication date :

    2011-01-01



    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



    Identification of Correlated Damage Parameters under Noise and Bias Using Bayesian Inference

    An, D. / Choi, J. / Kim, N.H. et al. | British Library Conference Proceedings | 2011




    Bayesian Tangent Shape Model: Estimating Shape and Pose Parameters via Bayesian Inference

    Zhou, Y. / Gu, L. / Zhang, H.-J. et al. | British Library Conference Proceedings | 2003


    Temporal Phase Unwrapping Using Bayesian Inference

    Cuenca, M.C. / Hanssen, R.F. / European Space Agency | British Library Conference Proceedings | 2010