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    Title :

    New approaches to reliability qualification of semiconductor components under varying and progressive stresses


    Contributors:
    Hirler, Alexander (author) / Deutschland, Bundeswehr (degree granting institution) / Eric Cuvillier, Firma (publisher)

    Edition :

    1. Auflage


    Publication date :

    2021


    Size :

    vi, 152 Seiten


    Remarks:

    21 cm x 14.8 cm
    Diagramme, Illustrationen
    Literaturverzeichnis: Seite 137-146
    Digital preservation by Gottfried Wilhelm Leibniz Bibliothek - Niedersächsische Landesbibliothek



    Type of media :

    Theses


    Type of material :

    Print


    Language :

    English



    Classification :

    BKL:    55.21 Kraftfahrzeuge / 53.51 Bauelemente der Elektronik



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