Reliability analysis and comparison of demodulation methods for Raman distributed temperature sensor

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Reliability analysis and comparison of demodulation methods for Raman distributed temperature sensor

Luo, S. / Chang, J. / Zhang, S. S. / Wang, Z. L. / Jiang, S. / Sun, B. N. / Jia, C. W. / Wang, F. P.

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Title :

Reliability analysis and comparison of demodulation methods for Raman distributed temperature sensor

Contributors:

Luo, S. (author) / Chang, J. (author) / Zhang, S. S. (author) / Wang, Z. L. (author) / Jiang, S. (author) / Sun, B. N. (author) / Jia, C. W. (author) / Wang, F. P. (author)

Published in:

OPTICAL AND QUANTUM ELECTRONICS ; 46 , 12 ; 1595-1608

Publication date :

2014-01-01

Size :

14 pages

ISSN :

0306-8919

Type of media :

Article (Journal)

Type of material :

Language :

English

Classification :

DDC:

537.5

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