Topography measurement of nanometer synchrotron optics [4782-02]

You are here: Homepage > Search

Topography measurement of nanometer synchrotron optics [4782-02]

Illemann, J. / Geckeler, R. D. / Weingartner, I. / Schlewitt, C. / Grubert, B. / Schnabel, O. / International Society for Optical Engineering

Access

Access via TIB

Check availability in my library

Order at Subito €

Export, share and cite

Document information

Title :

Topography measurement of nanometer synchrotron optics [4782-02]

Contributors:

Illemann, J. (author) / Geckeler, R. D. (author) / Weingartner, I. (author) / Schlewitt, C. (author) / Grubert, B. (author) / Schnabel, O. (author) / Freund, A. K. / International Society for Optical Engineering

Conference:

conference, X-ray mirrors crystals and multilayers ; 2002 ; Seattle, WA

Published in:

X-ray mirrors crystals and multilayers ; 29-37

PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 4782

Publication date :

2002-01-01

Size :

9 pages

ISBN :

0819445495

ISSN :

0277-786X

Type of media :

Conference paper

Type of material :

Language :

English

Keywords :

X-ray mirrors , SPIE , crystals , multilayers

Freund, A. K. / International Society for Optical Engineering | British Library Conference Proceedings | 2002

Nr. 4782

DataCite | 1937

Irradiation of EUV multilayers optics with synchrotron radiation of a different time structure [4782-39]

Klein, R. / Scholze, F. / Thornagel, R. et al. | British Library Conference Proceedings | 2002

Nickel-plated invar mirrors for synchrotron radiation beam lines [4782-12]

Howells, M. R. / Burt, P. / Cambie, D. et al. | British Library Conference Proceedings | 2002

High-resolution carbon/carbon multilayers [4782-22]

Baranov, A. M. / Dietsch, R. / Holz, T. et al. | British Library Conference Proceedings | 2002

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles