1–20 of 43 hits
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    Uniform target acceleration and imprinting studies with the Nike KrF lasers

    Obenschain, S.P. / Pawley, C.J. / Gerber, K. et al. | IEEE | 1997

    Femtosecond time-reversal in photorefractive polymers

    Giessen, H. / Christ, A. / Wagner, A. et al. | IEEE | 1999

    Traveling-wave scheme for the transient pumping of x-ray laser with a sub-ps TW pulse

    Chanteloup, J.C. / Salmon, E. / Sauteret, C. et al. | IEEE | 1999

    Novel properties of photonic-band-gap waveguides

    Notomi, M. / Shinya, A. / Kuramochi, E. et al. | IEEE | 2002

    Zinc oxide as a contact material for p-GaN

    Kaminska, E. / Piotrowska, A. / Barcz, A. et al. | IEEE | 2002

    Fabrication and evaluation of submicron-square Si wire waveguides with spot size converters

    Tsuchizawa, T. / Watanabe, T. / Tamechika, E. et al. | IEEE | 2002

    A fiber-based vertically emitting semiconductor laser at 850 nm

    Balocchi, A. / Warburton, R.J. / Kutschera, H.-J. et al. | IEEE | 2002

    Signal denoising in tree-structured Haar basis

    Pogossova, E. / Egiazarian, K. / Astola, J. | IEEE | 2003

    Self-organized form birefringence in glass irradiated by intense ultrashort light pulses

    Kazansky, P.G. / Mills, J. / Bricchi, E. et al. | IEEE | 2003

    Simple design of nonuniform fiber Bragg grating with sharp reflection

    Turitsyna, E. / Ania-Castanon, J. / Turitsyn, S. et al. | IEEE | 2003

    KGW:Yb, Er single crystals growth for eye-safe lasers

    Majchrowski, A. / Mierczyk, Z. / Kopczynski, K. et al. | IEEE | 2003

    Optical stimulation of neural tissue

    Mahadevan-Jansen, A. / Mariappan, K. / Albea, J. et al. | IEEE | 2003

    Flexible laser ion sources for surface modification

    Boody, F.P. / Kempf, J. / Hora, H. et al. | IEEE | 2003

    Soft X-ray microscopy and EUV lithography: imaging in the 20-40 nm regime

    Attwood, D. / Anderson, E. / Chao, W. et al. | IEEE | 2003

    The Herschel-Heterodyne Instrument for the Far-Infrared (HIFI)

    de Graauw, T. / Caux, E. / Gusten, R. et al. | IEEE | 2004