61–70 of 123 hits
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    High fidelity propagation modelling in real time

    Levitas, M. / Pham Huong / Spaulding, B. | Tema Archive | 1997
    Publisher: Institute of Electrical and Electronics Engineers (IEEE) , New York

    High-order finite-difference methods in computational electromagnetics

    Zingg, D.W. | Tema Archive | 1997
    Publisher: Institute of Electrical and Electronics Engineers (IEEE) , New York

    Image reconstruction for EM penetration and interference

    Balanis, C.A. / Tirkas, P.A. | Tema Archive | 1997
    Publisher: Institute of Electrical and Electronics Engineers (IEEE) , New York

    Implementation of a 'perfect launch' process to improve the effectiveness of automotive new product ramps

    Hempleman, G.L. | Tema Archive | 1998
    Publisher: Institute of Electrical and Electronics Engineers (IEEE) , New York

    Improvements to the Integrated TIGER Series Monte Carlo radiation transport codes

    Smith, L.M. / Hochstedler, R.D. | Tema Archive | 1997
    Publisher: Institute of Electrical and Electronics Engineers (IEEE) , New York

    Incremental avionics upgrades for legacy aircraft

    Nelson, J. | Tema Archive | 1997
    Publisher: Institute of Electrical and Electronics Engineers (IEEE) , New York

    Initial attitude determination and correction of gyro-free INS angular orientation on the basis of GPS linear navigation parameters

    Mostov, K.S. / Soloviev, A.A. / Koo, T.K.J. | Tema Archive | 1997
    Publisher: Institute of Electrical and Electronics Engineers (IEEE) , New York

    Integrating the cost of satellite sensors and payloads in the space systems architecture decision making process

    Purvis, C.W. / Butterworth, M.L. | Tema Archive | 1997
    Publisher: Institute of Electrical and Electronics Engineers (IEEE) , New York

    JSF affordable avionics study

    Groat, J. / Sawamura, B. / Spiers, B. et al. | Tema Archive | 1997
    Publisher: Institute of Electrical and Electronics Engineers (IEEE) , New York

    LCCA-life cycle cost analysis

    Riedel, T. / Tiemann, N. / Wahl, M.G. et al. | Tema Archive | 1998
    Publisher: Institute of Electrical and Electronics Engineers (IEEE) , New York