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    0.1 mu m InGaAs/InAlAs/InP HEMT MMICs - a flight qualified technology

    Chou, Y.C. / Leung, D. / Lai, R. et al. | Tema Archive | 2002
    Keywords: Prüfung integrierter Schaltungen

    2D Modeling of pulsed THz interrogation of SOFI with knit lines

    Banks, H.T. / Gibson, N.L. / Winfree, W.P. | Tema Archive | 2007
    Keywords: zerstörungsfreie Prüfung

    3D finite element analysis of marine steel plate magnetic leakage testing

    Li, Han-Lin / He, Yi-dong / Lin, Jun-ming et al. | Tema Archive | 2008
    Keywords: zerstörungsfreie Prüfung

    3-layered 3D flex based MCM: electrical characterization and reliability issues

    Morrison, W.B. / Railkar, T.A. / Malshe, A.P. et al. | Tema Archive | 1999
    Keywords: Prüfung integrierter Schaltungen

    Accelerated acid etch. Part II: Refined test procedure to reproduce automotive acid etch provides improved lab practicality and proven correlation

    Boisseau, J. / Campbell, D. / Marino, M. et al. | Tema Archive | 2008
    Keywords: beschleunigte Prüfung

    Accelerated test based on eis to predict buried steel pipe corrosion

    Goodman, N.B. / Muster, T.H. / Davis, P. et al. | Tema Archive | 2013
    Keywords: beschleunigte Prüfung

    Accelerated testing of flip chip packages under dynamic load

    Rau, I. / Miessner, R. / Liebing, G. et al. | Tema Archive | 2001
    Keywords: dynamische Prüfung , beschleunigte Prüfung

    Accelerated tribological testing of automotive components

    Shuster, M. / Deis, M. / Burke, D. et al. | Tema Archive | 1998
    Keywords: beschleunigte Prüfung