Exploitation of Electronic Devices - Selected Issues
Gearing up for the “more electric” aircraft
Status of JEDEC JC13 TG17-01 MIL-STD-883 Test Method 2020 PIND Task Group Work
An Experimental Approach to Monitor the Clutch Thermal Condition to Increase the Clutch Life
Evaluation of Single-Event Upset Tolerance on Recent Commercial Memory ICs
Flight Usage of Microwave Transistor Life Test Samples
Boundary Scan: Moving Test Up to Higher Integration Levels
THX 7887A: et TH 7888A: deux nouveaux capteurs d'images CCD de 1024 x 1024 pixels et a fort debit
CTS21 & CTC21: Solid Tantalum Capacitors for Switching Power Supplies and Converters
The Conversion to Space Parts Standardisation - A Manufacturer's Prospective
Single Event Latchup Protection of Integrated Circuits
High Performance, Crystal Oscillators for Space Applications
12000 Pixel Monolithic CCD Linear Image Sensor for High Resolution Instruments
Ultra-Stable Crystal and Rubidium Oscillators for Space Applications
Grain Boundary Sliding in Platinum Resistance Temperature Sensors
Quick Turn-Around Evaluation Concept for Complex, State-of-the-Art Microcircuits