search-head

You are here: Homepage >  Search

Steinert, J.   Gliech, S.   Clear all
1–5 of 5 hits
|
Sort by:

    DUV/VUV light scattering measurement of optical components for lithography applications [4099-10]

    Gliech, S. / Steinert, J. / Flemming, M. et al. | British Library Conference Proceedings | 2000

    Advanced methods for surface and subsurface defect characterization of optical components [4099-34]

    Steinert, J. / Gliech, S. / Wuttig, A. et al. | British Library Conference Proceedings | 2000

    VUV light-scattering measurements of substrates and thin film coatings [5188-14]

    Hultaker, A. / Gliech, S. / Benkert, N. et al. | British Library Conference Proceedings | 2003

    Microroughness analysis of thin film components for VUV applications [4099-13]

    Ferre-Borrull, J. / Duparre, A. / Steinert, J. et al. | British Library Conference Proceedings | 2000

    X-ray study of surfaces and interfaces [4449-31]

    Asadchikov, V. E. / Bukreeva, I. N. / Duparre, A. et al. | British Library Conference Proceedings | 2001
    Contributors: Duparre, A.

Number of results
10 50

Filter search results