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title: 2009 ieee electric ship technologies symposium (tests) • title: 2019 ieee electric ship technologies symposium (test)

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    Role of hardware-in-the-loop simulation testing in transitioning new technology to the ship

    Langston, James / Sloderbeck, Michael / Steurer, Michael et al. | IEEE | 2013
    considered in crafting the role of these tests into an overall testing program. This paper discusses some of these considerations, along with ...
    Publisher: IEEE

    An Exercise on Model Description Document based Implementation of Shipboard Power System Modules on DRTS Platforms

    Ravindra, Harsha / Difronzo, Michele / Almeida, Murilo et al. | IEEE | 2019
    This paper provides an example of implementing ship power system modules on different digital real time simulator (DRTS) platforms ...
    Publisher: IEEE

    Demonstration of Solid State Circuit Breakers within Low Voltage DC Distribution System for Shipboard Applications

    Langston, James / Hauer, John / Leonard, Isaac et al. | IEEE | 2019
    Publisher: IEEE

    Power Hardware-in-the-Loop Simulation Testing of a 200 MJ Battery-Based Energy Magazine for Shipboard Applications

    Langston, James / Steurer, Michael / Bosworth, Matthew et al. | IEEE | 2019
    Publisher: IEEE

    Shipboard Power System Baseline Modeling and Evaluation

    Schoder, Karl / Ravindra, Harsha / Stanovich, Mark et al. | IEEE | 2019
    next generation platforms. Before possible benefits of new technologies can be evaluated in a system-relevant context, baseline information on ...
    Publisher: IEEE

    Megawatt-scale power hardware-in-the-loop simulation testing of a power conversion module for naval applications

    Langston, James / Bogdan, Ferenc / Hauer, John et al. | IEEE | 2015
    module for naval applications was conducted. In these tests, the device-under-test (DUT) was interfaced to a virtual surrounding system that was ...
    Publisher: IEEE

    Graph Based Power Flow Algorithm for Single Phase Radial and Weakly Meshed Distribution System in the presence of Distributed Generations

    Murari, Krishna / Van Vu, Tuyen / Anam, MD Isfakul et al. | IEEE | 2023
    problem. Pertinent tests have been completed to examine the convergence nature and computational ability of the proposed PF technique. ...
    Publisher: IEEE

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