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keywords:(Transmissionselektronenmikroskopie)

    The effect of partial replacement of carbon black by carbon nanotubes on the properties of natural rubber/butadiene rubber compound

    Poikelispää, Minna / Das, Amit / Dierkes, Wilma et al. | Tema Archive | 2013
    Keywords: Transmissionselektronenmikroskopie

    Properties of the weld metal of two-sided welded joints on pipes made from increased-strength microalloyed steels

    Rybakov, A.A. / Semyonov, S.E. / Filipchuk, T.N. | Tema Archive | 2013
    Keywords: Transmissionselektronenmikroskopie

    A sol-gel based magneto-optical device for the NANOSAT space mission

    Zayat, M. / Pardo, R. / Rosa, G. et al. | Tema Archive | 2009
    Keywords: Transmissionselektronenmikroskopie

    Study of microstructure and cementite in automobile beam steels produced by compact strip production with flexible technologies

    Yu, Hao / Kang, Yonglin / Zhao, Zhengzhi et al. | Tema Archive | 2005
    Keywords: Transmissionselektronenmikroskopie

    Microstructure and mechanical properties of a kind of Nb-V micro-alloyed forging steel

    Zhao, Yang / Chen, Li-qing / Xu, Xiang-qiu et al. | Tema Archive | 2009
    Keywords: Transmissionselektronenmikroskopie

    Stability of the microstructure and microhardness of a cast TiAl-based intermetallic alloy for turbine blades

    Lapin, J. / Pelachova, T. | Tema Archive | 2004
    Keywords: Transmissionselektronenmikroskopie

    Nb-base FS-85 alloy as a candidate structural material for space reactor applications: Effects of thermal aging

    Leonhard, Keith J. / Busby, Jeremy T. / Hoelzer, David T. et al. | Tema Archive | 2009
    Keywords: Transmissionselektronenmikroskopie

    Microscopy study of intergranular stress corrosion cracking of X-52 line pipe steel

    Elboujdaini, M. / Li, J. / Fang, B. et al. | Tema Archive | 2006
    Keywords: Transmissionselektronenmikroskopie

    Microstructure of the worn surfaces of a bainitic steel railway crossing

    Zhang, F.C. / Lv, B. / Zheng, C.L. et al. | Tema Archive | 2010
    Keywords: TEM (Transmissionselektronenmikroskopie)

    A complete methodology for assessing GaN behaviour for military applications

    Moreau, C. / Le Pipec, M. / Tence, S. et al. | Tema Archive | 2010
    Keywords: Transmissionselektronenmikroskopie