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Hora, Joseph L. / Fazio, Giovanni G. / Allen, Lori E. et al. | SPIE | 2004

Smith, D.A / Martin, C / Kassebom, M et al. | Elsevier | 2003

Major, A. / Yoshino, F. / Nikolakakos, I. et al. | IEEE | 2003

Major, A. / Nikolakakos, I. / Aitchison, J.S. et al. | IEEE | 2003

Grivas, C. / Shepherd, D.P. / May-Smith, T.C. et al. | IEEE | 2003

Thrush, E. / Levi, O. / Ha, W. et al. | IEEE | 2003

Kerzhanovich, V.V. / Cutts, J.A. / Cooper, H.W. et al. | Elsevier | 2003

Smith, G.M. / Yang, G. / Davis, M.K. et al. | IEEE | 2003

Smith, G.Louis / Wielicki, Bruce A. / Barkstrom, Bruce R. et al. | Elsevier | 2003

Calkins, Frederick / Mabe, James / Smith, Josef et al. | AIAA | 2002