X-ray study of the roughness of surfaces and interfaces [4099-12]
X-ray study of surfaces and interfaces [4449-31]
X-ray investigations of a near surface layer of metal samples [4099-33]
VUV light-scattering measurements of substrates and thin film coatings [5188-14]
Use of light scatter signals to identify particle material (Invited Paper) [4449-17]
Stitching interferometry of aspherical surfaces [4449-34]