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publisher:(Institute of Electrical and Electronics Engineers)

    Economics of diagnosis

    Ambler, A.P. / Bassat, M.B. / Ungar, L.Y. | Tema Archive | 1997
    Publisher: Institute of Electrical and Electronics Engineers (IEEE) , New York

    Test education: a CASS perspective

    Ungar, L.Y. / MacMillan, J. | Tema Archive | 1997
    Publisher: Institute of Electrical and Electronics Engineers (IEEE) , New York