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Vacuum-chamber testing of space-exposed SPEAR-I HV components
Plastic ICs for military equipment cost reduction challenge and feasibility demonstration
Noise-immune multisensor speech input: formal subjective testing in operational conditions
Navigation accuracy of integrated GPS and INS under flight conditions
Chrysler ups quality with PLC-driven latch testers
A specific design approach for automotive microcomputers
A 150-MHz 1.25 mu m CMOS/SOS DSP integrated circuit