Safety Level of the IMO Second Generation Intact Stability Criteria
High efficiency 10-micron-pitch 64x64 addressable VCSEL array with intracavity structure
3D hologram optical element for angle measuring devices and sighting systems
Analysis of defect-related optical degradation of VCSILs for photonic integrated circuits
Iodine based reference laser for ground tests of LISA payload
TRUTHS: towards the in-flight calibration of a hyperspectral imager to SI traceable standards