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Bahk, S.-W. / Yanovsky, V. / Mourou, G. | IEEE | 2005

Naumova, N. / Mourou, G. / Nees, J. et al. | IEEE | 2003

Chvykov, V. / Yanovsky, V. / Bahk, S.-W. et al. | IEEE | 2003

Queneuille, J. / Druon, F. / Maksimchuk, A. et al. | IEEE | 1999

Bahk, S. / Chvykov, V. / Kalintchenko, G. et al. | IEEE | 2004

Biswal, S. / Druon, F. / Nishimura, A. et al. | IEEE | 1997

Mordovanaki, A.G. / Nelson, N. / Hou, B. et al. | IEEE | 2004

Biswal, S. / Druon, F. / Nees, J. et al. | IEEE | 1997

Hsiao-Hua Liu, / Biswal, S. / Paye, J. et al. | IEEE | 1999

Yanovsky, V. / Chvykov, V. / Reed, S. et al. | IEEE | 2005

Yanovsky, V. / Chvykov, V. / Bahk, S.-W. et al. | IEEE | 2003

Liu, H. / Nees, J. / Mourou, G. et al. | IEEE | 2001

Yoshitomi, D. / Miyamoto, N. / Kanai, T. et al. | IEEE | 2003

Le Blanc, S.P. / Downer, M.C. / Wagner, R. et al. | IEEE | 1997

Yu-Chung Chang, / Mordovanakis, A. / Kai-Chung Hou, et al. | IEEE | 2005

Power, E. / Naumova, N. / Nees, J. et al. | IEEE | 2004

Moses, J.A. / Wise, F.W. / Vuong, L. et al. | IEEE | 2005