1–10 of 18 hits
|

    Evolution of dislocation loops in He ion irradiated nickel under different temperature

    H. C. Chen | Online Contents | 2016
    Keywords: Transmission electron microscopes

    Deformation mechanisms of an Omega precipitate in a high-strength aluminum alloy subjected to high strain rates

    Elkhodary, K. / Lee, W. / Sun, L.P. et al. | Tema Archive | 2011
    Keywords: hochauflösendes Transmissionselektronenmikroskop

    Microstructure of the worn surfaces of a bainitic steel railway crossing

    Zhang, F.C. / Lv, B. / Zheng, C.L. et al. | Tema Archive | 2010
    Keywords: TEM (Transmissionselektronenmikroskopie)

    Development of Cu-bearing bake-hardenable steel sheets for automotive exposed panels

    Hong, Moon-Hi / Cho, Noi-Ha / Kim, Sung-Il et al. | Tema Archive | 2010
    Keywords: TEM (Transmissionselektronenmikroskopie)

    Interfacial microstructure and strength of steel/aluminum alloy joints welded by resistance spot welding with cover plate

    Qiu, Ranfeng / Iwamoto, Chihiro / Satonaka, Shinobu | Tema Archive | 2009
    Keywords: Transmissionselektronenmikroskop

    Investigation of dynamic driving cycle effect on performance degradation and micro-structure change of PEM fuel cell

    Lin, R. / Li, B. / Hou, Y.P. et al. | Tema Archive | 2009
    Keywords: TEM (Transmissionselektronenmikroskopie)

    Pt rate at MOF-177: synthesis, room-temperature hydrogen storage and oxidation catalysis

    Proch, Sebastian / Herrmannsdörfer, Justus / Kempe, Rhett et al. | Tema Archive | 2008
    Keywords: TEM (Transmissionselektronenmikroskopie)

    Effect of bonding temperature on the precipitation of delta phase in diffusion bonded Inconel 718 joints

    Zhang, Guoge / Chandel, Roop Singh / Pheow, Seow Hong et al. | Tema Archive | 2006
    Keywords: TEM (Transmissionselektronenmikroskop)

    Characterisation of thermoset laminates for cosmetic automotive applications: Part III - Shrinkage control via nanoscale reinforcement

    Schubel, Peter J. / Johnson, Michael S. / Warrior, Nicholas A. et al. | Tema Archive | 2006
    Keywords: TEM (Transmissionselektronenmikroskop)