Synonyms were used for: Prüfung
Search without synonyms: keywords:("Prüfung")

21–40 of 1,937 hits
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    Potential and documented cost-savings using IN-ATE

    Cantone, R. | Tema Archive | 1987
    Keywords: ELECTRONIC EQUIPMENT TESTING

    Testability allocation and program monitoring for fault-tolerant systems prior to detailed design

    Allen, D. / Joe, E. / Fleming, R. et al. | Tema Archive | 1987
    Keywords: ELECTRONIC EQUIPMENT TESTING

    An integrated automatic measuring system for internal ballistics testing

    Bond, D.F. | Tema Archive | 1988
    Keywords: FRACTURE TOUGHNESS TESTING , INTERNAL BALLISTICS TESTING , ARMS TESTING

    An overview of SEDACS: a state of the art TRD/TPS environment

    Hansch, M.R. | Tema Archive | 1988
    Keywords: ELECTRONIC EQUIPMENT TESTING , PRODUCTION TESTING

    Approaches and implementation of software test and development system for embedded computer systems

    Zipori, H. / Sagiv, Z. / Yossovitch, A. | Tema Archive | 1988
    Keywords: FUNCTIONAL TESTING

    A comprehensive strategy for implementing BIT (weapon systems)

    Doskocil, D.C. | Tema Archive | 1988
    Keywords: ELECTRONIC EQUIPMENT TESTING

    Movement measurements during flight tests of a missile

    Deniau, P. / Devars, J. | Tema Archive | 1988
    Keywords: AEROSPACE TESTING

    Interfacing sensor assemblies with windowless cockpit displays

    Devore, J.J. | Tema Archive | 1988
    Keywords: ELECTRONIC EQUIPMENT TESTING

    Diagnostic testing of transformers on British Railways

    Bradwell, A. / Smith, D.A. / Harrison, N. et al. | Tema Archive | 1988
    Keywords: TRANSFORMER TESTING

    Radiation testing of semiconductor devices for space electronics

    Pease, R.L. / Johnston, A.H. / Azarewicz, J.L. | Tema Archive | 1988
    Keywords: RADIATION TESTING OF SEMICONDUCTOR DEVICES

    Estimating time delay and transfer function parameters using wideband transient signals

    George, J.D. / Goodman, D.M. | Tema Archive | 1988
    Keywords: ELECTRONIC EQUIPMENT TESTING

    Cost effective vibration testing for automotive electronics

    Wennberg, S.R. / Freyler, C.R. | Tema Archive | 1989
    Keywords: COST EFFECTIVE VIBRATION TESTING , DESIGN QUALIFICATION TESTING

    Conversion of the PACE1750A CMOS chip set to silicon on sapphire (for military equipment)

    Fitzpatrick, M.D. / Adams, D.A. / Austin, M. et al. | Tema Archive | 1989
    Keywords: CHARACTERIZATION TESTING , INSERTION TESTING

    An American knowledge base in England: alternate implementations of an expert system flight status monitor

    Butler, G.F. / Graves, A.T. / Disbrow, J.D. et al. | Tema Archive | 1989
    Keywords: AEROSPACE TESTING , FLIGHT TESTING

    NDE in aerospace-requirements for science, sensors and sense

    Heyman, J.S. | Tema Archive | 1989
    Keywords: AEROSPACE TESTING , ULTRASONIC MATERIALS TESTING

    CHEMICAL METHODS FOR THE MEASUREMENT OF NONREGULATED DIESEL EMISSIONS

    SAE Technical Papers | 1989
    Keywords: Environmental testing

    Multi-level software testing based on cyclomatic complexity

    Emergy, K.O. / Mitchell, B.K. | Tema Archive | 1989
    Keywords: REQUIREMENTS-LEVEL TESTING , VITRO AUTOMATED STRUCTURED TESTING TOOL

    V&V of flight and mission-critical software

    Duke, E.L. | Tema Archive | 1989
    Keywords: SYSTEM TESTING

    Research in a high-fidelity acceleration environment

    Cammarota, J.P. | Tema Archive | 1989
    Keywords: AEROSPACE TESTING , TESTING ENVIRONMENT

    Unique vehicle technology in active support of two level maintenance (aircraft equipment testing)

    Britton, R. | Tema Archive | 1989
    Keywords: ELECTRONIC EQUIPMENT TESTING