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Edenborough, N. / Hammoud, R. / Harbach, A. et al. | IEEE | 2005

Collier, J.L. / Chekhlov, O. / Clarke, R.J. et al. | IEEE | 2005

Smith, M. / Khotanzad, A. | IEEE | 2004

Nikolakakos, I. / Major, A. / Aitchison, J.S. et al. | IEEE | 2004

Stanley, Maurice / Smith, Mark A. / Smith, Allan P. et al. | SPIE | 2004

Major, A. / Aitchison, J.S. / Smith, P.W.E. et al. | IEEE | 2004

Leesti, B. / Zilkie, A.J. / Aitchison, J.S. et al. | IEEE | 2004

Sood, A. / Bhadra, S. / Smith, P. et al. | IEEE | 2004

Russell, C.T. / Capaccioni, F. / Coradini, A. et al. | Elsevier | 2004

Clampin, Mark / Melnick, Gary J. / Lyon, Richard G. et al. | SPIE | 2004