Cost Effective Radiation Testing of Commercially Available Memories
Evaluation of a Photo-Imageable Multilayer Thick Film Technology
A Stress Analysis of Large-Size Plastic Encapsulated Microelectronics with Thermal Cycle Test
Californium-252 SEE Evaluation of 32-bit Floating Point DSP Test Systems
An Assessment of Long Term Degradation Mechanisms in GaAs MMICs
Evaluation of Single-Event Upset Tolerance on Recent Commercial Memory ICs
Flight Usage of Microwave Transistor Life Test Samples
Boundary Scan: Moving Test Up to Higher Integration Levels
THX 7887A: et TH 7888A: deux nouveaux capteurs d'images CCD de 1024 x 1024 pixels et a fort debit
CTS21 & CTC21: Solid Tantalum Capacitors for Switching Power Supplies and Converters
The Conversion to Space Parts Standardisation - A Manufacturer's Prospective
Reliability Behaviour of a Radiation Tolerant 0.6 m CMOS Technology
Improving Reliability of Electronic Assemblies Using Early Physical and Electrical Indicators
Applications of Trap Characterisation in III-V Devices: Modeling and/or Technological Improvement
Colloquium: From Microengineering to Nanotechnology
Hot Carrier Reliability Simulation for CMOS Analog Circuits