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    Bayesian network for characterizing model uncertainty of liquefaction potential evaluation models

    Huang, H. W. / Zhang, J. / Zhang, L. M. | Springer Verlag | 2012

    Integrated Silicon PIN Photodiodes Using Deep N-Well in a Standard 0.18-μm CMOS Technology

    Ciftcioglu, B. / Zhang, L. / Zhang, J. et al. | British Library Online Contents | 2009