The influence of VLSI technology evolution on radiation-induced latchup in space systems
Experimental studies of single-event gate rupture and burnout in vertical power MOSFET's
A review of the techniques used for modeling single-event effects in power MOSFET's
Cosmic and terrestrial single-event radiation effects in dynamic random access memories
Improved understanding of the earth's radiation belts from the CRRES satellite
Low LET cross-section measurements using high energy carbon beam (DRAMs/SRAMs)