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Alberti, G. / Alvino, A. / Ambrosi, G. et al. | IEEE | 2014

Schippers, H. / Verpoorte, J. / Jorna, P. et al. | IEEE | 2008

Schippers, H. / Verpoorte, J. / Jorna, P. et al. | IEEE | 2009

Xue, Jie / Van Gelder, P. H. A. J. M. / Papadimitriou, Eleonora et al. | IEEE | 2019

Joyner, C.H. / Pleumeekers, J.L. / Mathur, A. et al. | IEEE | 2005

Kory, C. / Ives, L. / Read, M. et al. | IEEE | 2005

Van Wonterghem, J. / Alloumf, A. / Boutros, J.J. et al. | IEEE | 2016

Dutta, R. / Kokkeler, A. B. J. / van der Zee, R. A. R. et al. | IEEE | 2011

Thompson, M.G. / Marinelli, C. / Chu, Y. et al. | IEEE | 2004

van Rossum, W L / de Wit, J J M / Otten, M P G et al. | IEEE | 2011

Wang, F. / Cheever, D. / Franklin, W. et al. | IEEE | 2005