Experimental studies of single-event gate rupture and burnout in vertical power MOSFET's
The influence of VLSI technology evolution on radiation-induced latchup in space systems
A review of the techniques used for modeling single-event effects in power MOSFET's
Improved understanding of the earth's radiation belts from the CRRES satellite
Cosmic and terrestrial single-event radiation effects in dynamic random access memories
SEU results from the advanced photovoltaic and electronics experiments (APEX) satellite
Heavy-ion single-event effects testing of lead-on-chip assembled high-density memories
The effects of radiation on science instruments during grand tour type missions