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Tran, M.Q. / Alberti, S. / Arnold, A. et al. | IEEE | 2004

Dammertz, G. / Alberti, S. / Arnold, A. et al. | IEEE | 2004

Erckmann, V. / Braune, H. / Laqua, H.P. et al. | IEEE | 2005

Dammertz, G. / Arnold, A. / Borie, E. et al. | IEEE | 2005

Winnerl, S. / Stehr, D. / Drachenko, O. et al. | IEEE | 2006

Piosczyk, B. / Alberti, S. / Benin, P. et al. | IEEE | 2006

Dammertz, G / Alberti, S. / Arnold, A. et al. | IEEE | 2006

Thumm, M. / Alberti, S. / Arnold, A. et al. | IEEE | 2006

Tito, Dennis A. / Anderson, Grant / Carrico, John P. et al. | IEEE | 2013

Parolari, R. / Gallo, M. / Filisan, A. Polo et al. | IEEE | 2017

Edwards, Charles D. / Asmar, Sami / Bruvold, Kristoffer N. et al. | IEEE | 2017

Maldonado, Carlos A. / Deming, Jonathan / Mosley, Brooke N. et al. | IEEE | 2022

Donitz, Benjamin P. S. / Mages, Declan / Tsukamoto, Hiroyasu et al. | IEEE | 2023

Maldonado, Carlos A. / Deming, Jonathan / Mosley, Brooke N. et al. | IEEE | 2023