IGBT modules for railway traction applications must be more intensively tested than those for industrial applications. This paper describes the state of the art of existing reliability tests as well as a proposal for accelerated power cycling and temperature cycling tests. These tests are a result of the Brite EuRam research project RAPSDRA (reliability of advanced power semiconductor devices for railway traction application).


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    Title :

    Advanced IGBT modules for railway traction applications: Reliability testing


    Contributors:
    Berg, H. (author) / Wolfgang, E. (author)


    Publication date :

    1998


    Size :

    5 Seiten, 16 Quellen




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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