Data compiled by the Institute of Environmental Sciences were used to establish guidelines for identifying defective, abnormal, or marginal parts as well as manufacturing defects. These data are augmented with other available sources of similar information in conjunction with NASA centers' data and presented in a form that may be useful to all NASA centers in planning and developing effective environmental stress screens. Information relative to thermal and vibration screens as the most effective methods for surfacing latent failures in electronic equipment at the component level is considered.


    Access

    Access via TIB

    Check availability in my library


    Export, share and cite



    Title :

    Nasa Flight Electronics Environmental Stress Screening Survey


    Contributors:

    Publication date :

    1983


    Size :

    40 pages


    Type of media :

    Report


    Type of material :

    No indication


    Language :

    English





    NASA Spinoffs: Electronics

    Online Contents | 2004


    Seismic Noise Survey. NASA Goddard Space Flight Center

    W. V. Mickey / T. R. Shugart | NTIS | 1964



    Nasa Space Electronics Research

    Vacca, G. A. | NTRS | 1964