Experimental investigation of the electromagnetic fields at the aperture of a near-field scanning optical microscope
Experimental investigation of the electromagnetic fields at the aperture of a near-field scanning optical microscope
- New search for: Decca, R.S.
- New search for: Drew, H.D.
- New search for: Emison, K.L.
- New search for: Tabatabaei, S.
- New search for: Decca, R.S.
- New search for: Drew, H.D.
- New search for: Emison, K.L.
- New search for: Tabatabaei, S.
In this work we use an approach that allows a determination of the spatial distribution of the electromagnetic field in the near-field region of the near field scanning optical microscope (NSOM) probe. We studied a MBE grown sample, which contains a 9 nm AlAs layer embedded in a GaAs matrix. The optical contrast arises from the difference in the index of refraction of the two materials. Topography related contrast is avoided by studying a freshly cleaved surface. With the NSOM working in emission mode the reflected light was collected in the far field.
Document information
Experimental investigation of the electromagnetic fields at the aperture of a near-field scanning optical microscope
1996-01-01
189552 byte
Conference paper
Electronic Resource
English
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