Measurement method, measurement device, measurement system, and measurement program
Measurement method, measurement device, measurement system, and measurement program
- New search for: KOBAYASHI YOSHIHIRO
- New search for: KOBAYASHI YOSHIHIRO
A measurement method includes: a step of acquiring first observation point information; a step of acquiring second observation point information; a step of calculating a path deflection waveform at a third observation point; a step of calculating a path deflection waveform at a central position between the first observation point and the second observation point; a step of calculating a measurement waveform as a physical quantity at the third observation point; a step of calculating an amplitude coefficient at which a difference is minimized between the measurement waveform and a waveform obtained by multiplying the path deflection waveform at the third observation point by the amplitude coefficient; and a step of calculating, based on the path deflection waveform at the central position and the amplitude coefficient, an estimation waveform as a physical quantity at the central position.
Document information
Measurement method, measurement device, measurement system, and measurement program
2024-01-23
Patent
Electronic Resource
English
Similar titles
MEASUREMENT SYSTEM, VEHICLE, MEASUREMENT METHOD, MEASUREMENT DEVICE AND MEASUREMENT PROGRAM
| European Patent Office | 2021
Measurement Method, Measurement Device, Measurement System, And Measurement Program
| European Patent Office | 2023
Measurement method, measurement device, measurement system, and measurement program
| European Patent Office | 2022
Measurement Method, Measurement Device, Measurement System, And Measurement Program
| European Patent Office | 2023
MEASUREMENT DEVICE, MEASUREMENT SYSTEM, MEASUREMENT METHOD AND PROGRAM
| European Patent Office | 2022