Microstructural models to predict creep fatigue reliability

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Bhamidipati,V. / Tryon,R. / Holmes,R. / VEXTEC,US

Title :

Additional title:

Mikrostrukturelle Modelle fuer die Voraussage der Zuverlaessigkeit gegen Ermuedung durch Kriechen.

Contributors:

Bhamidipati,V. (author) / Tryon,R. (author) / Holmes,R. (author) / VEXTEC,US

Publication date :

2007

Size :

9 pages

Remarks:

SAE-Paper;2001-01-1774;2007;Reliability and Robust Design in Automotive Engineering;SAE Spec.Publ.; SP-2119

Type of media :

Miscellaneous

Type of material :

Language :

English

Holmes, Richard / Tryon, Robert / Bhamidipati, Vikram | SAE Technical Papers | 2007

Bhamidipati, V. / Tryon, R. / Holmes, R. et al. | British Library Conference Proceedings | 2007

Bhamidipati, V. / Tryon, R. / Holmes, R. et al. | British Library Conference Proceedings | 2007

Mahadevan, S. / Mao, H. / American Institute of Aeronautics and Astronautics et al. | British Library Conference Proceedings | 2000

Razdolsky, Leo | TIBKAT | 2019