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    Title :

    Investigation of Optimal Test Methods for High Performance EDL Capacitor- (Second Report)


    Contributors:
    Araki, S. (author) / Kinoshita, S. (author) / Sasaki, M. (author) / Matsui, H. (author) / Suzuki, T. (author) / Hayashi, K. (author) / Arai, K. (author) / Kishi, K. (author) / Yainashita, S. (author) / Takahashi, T. (author)

    Conference:

    Fall annual congress, Society of Automotive Engineers of Japan; 2007 JSAE annual congress: (Fall) ; 2007 ; Kyoto, Japan



    Publication date :

    2007-01-01


    Size :

    91-07


    Remarks:

    Text mainly Japanese.



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    Japanese




    Investigation of Optimal Test Methods for EDL Capacitor (1st Report)

    Sasaki, M. / Kinoshita, S. / Matsui, H. et al. | British Library Conference Proceedings | 2006



    Capacitor-Test System

    Ott, F. M. / Summers, R. A. | NTRS | 1985